515. JENA Optics Col­lo­quium – Dr. Daniel Claus

2026 May 12 Tue

17:00 – 19:00

Since May 2018, the tra­di­tio­nal JENA Carl Zeiss Optics Col­lo­quium has con­tin­ued as the JENA Optics Col­lo­quium at the Abbe Cen­ter of Pho­to­nics on the Beu­ten­berg Cam­pus in Jena and online. It is open to ever­yone inte­res­ted from rese­arch, indus­try, and edu­ca­tion, and ser­ves as a forum for new tech­no­lo­gies in photonics.

For the 515th edi­tion of the col­lo­quium, we are plea­sed to wel­come Dr. Daniel Claus and his presentation.

 

Ultra-high speed MHz opti­cal metro­logy applied to unco­ope­ra­tive tech­ni­cal and medi­cal samples

This talk will deal with various opti­cal metro­logy tech­ni­ques for the esti­ma­tion of 3D topo­gra­phy applied to indus­trial and medi­cal samples.

The infor­ma­tion pro­vi­ded via opti­cal metro­logy must ful­fill a large range of boun­dary con­di­ti­ons such as opti­cal reso­lu­tion, mea­su­re­ment uncer­tainty, mea­su­re­ment speed and cons­traints impo­sed by the sam­ple to be mea­su­red inclu­ding its environment.

The tech­no­lo­gies which will be dis­cus­sed in this pre­sen­ta­tion are focu­sed on ultra-high speed 3D topo­gra­phic metro­logy sys­tems offe­ring data rates of a few Mhz. It will be demons­tra­ted that these sys­tems work well at harsh envi­ron­men­tal con­di­ti­ons such as manu­fac­tu­ring work­shops or as a hand­held device in cli­ni­cal appli­ca­ti­ons with con­ti­nuously chan­ging refe­rence coor­di­nate sys­tem. Moreo­ver, the sam­ple its­elf with regards to its mea­su­re­ment sur­face and/or volume, such as spe­cu­lar reflec­tive and sur­face scat­te­ring, semi­trans­pa­rent or volume scat­te­ring, signi­fi­cantly influen­ces the choice of metro­logy technique.

With regards to the boun­dary con­di­ti­ons and appli­ca­tion sce­na­rio, dif­fe­rent metro­logy sys­tems will be pre­sen­ted based on chro­ma­tic con­fo­cal point sen­sors, chro­ma­tic con­fo­cal multi point sen­sors and sin­gle shot dual wave­length area sensor.

All of which are per­fectly sui­ted for their spe­ci­fic task, which will be high­ligh­ted within the presentation.

Dr. Daniel Claus

In 2006 Daniel Claus gra­dua­ted in mecha­ni­cal engi­nee­ring at the Tech­ni­sche Uni­ver­si­tät Ilmenau. From 2007–2010 he did his PhD at the Uni­ver­sity of War­wick (UK) focu­sing on reso­lu­tion impro­ve­ment tech­ni­ques applied digi­tal holo­gra­phy. From 2010–2013 he worked as a rese­arch asso­ciate at the Kroto Rese­arch Centre in Shef­field (UK) focu­sing on advan­cing pty­cho­gra­phy, an ite­ra­tive phase retrie­val technique.

From 2013–2017 he worked as a senior sci­en­tist at ITO in Stutt­gart focu­sing on the deve­lo­p­ment of novel quan­ti­ta­tive phase ima­ging tech­ni­ques, chro­ma­tic con­fo­cal spec­tral inter­fe­ro­me­try, elas­to­gra­phy and hyper­spec­tral holography.

From 2017–2022 he was lea­ding the metro­logy group at ILM in Ulm, working on chro­ma­tic con­fo­cal ima­ging for den­tal appli­ca­ti­ons, high speed digi­tal holo­gra­phy and lock-in thermography.

From 2022- now he has been working as a sys­tems engi­neer and pro­ject mana­ger at Swiss­op­tic (Mem­ber of the Jen­op­tik group), deve­lo­ping opti­cal sys­tems for medi­cal applications.


Par­ti­ci­pa­tion and boo­king conditions

  • The event is open to all inte­res­ted par­ti­ci­pants and can be boo­ked now.
  • The event will take place in a hybrid for­mat: in the Audi­to­rium of the Abbe Cen­ter of Pho­to­nics, Albert-Ein­stein-Str. 6, 07745 Jena, and online at: https://optonet-jena-de.zoom.us/j/88612730949
  • Par­ti­ci­pa­tion is free of charge.
  • The pre­sen­ta­tion will be held in Eng­lish.

The JENA Optics Col­lo­quium is sup­ported by: Carl Zeiss AG · Ernst-Abbe-Hoch­schule Jena · Fraun­ho­fer Insti­tute for Applied Optics and Pre­cis­ion Engi­nee­ring · Fried­rich Schil­ler Uni­ver­sity Jena · JENOPTIK AG · Leib­niz Insti­tute of Pho­to­nic Tech­no­logy e.V.
The event is orga­ni­zed by Opto­Net e.V.


History

The JENA Optics Col­lo­quium traces its ori­g­ins to a lec­ture series initia­ted by the Jena Zeiss Works in 1971, initi­ally estab­lished for the con­ti­nuing edu­ca­tion of employees. By attrac­ting high-pro­file spea­k­ers, it quickly deve­lo­ped into an important dis­cus­sion forum for the country’s lea­ding optics experts.

After 1989, the col­lo­quium was con­tin­ued in coope­ra­tion with the Insti­tute of Applied Optics at the Uni­ver­sity of Jena, repre­sen­ted by Prof. Kowar­schik. With the invol­vement of lea­ding sci­en­tists and com­pa­nies, as well as coope­ra­tion with insti­tu­ti­ons inclu­ding Fraun­ho­fer IOF and Leib­niz IPHT, it gai­ned fur­ther significance.


Note

By sub­mit­ting this regis­tra­tion form, you agree that your name will be included on a list of par­ti­ci­pants made available to the other atten­dees. You also agree that pho­tos from the event may be shown on our web­sites and social media accounts, unless you expressly object before the event.

Event Type

Loca­tion

Abbe Cen­ter of Photonics
Albert-Ein­stein-Straße 6
07745 Jena
Germany 

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Cont­act

Opto­Net e.V.
Paul Krei­bich

03641 327 92 96
ed.anej-tenotpo@hcibierk.luap
www.optonet-jena.de

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