SIOS Meß­tech­nik GmbH • WEB-Semi­nar: High pre­cis­ion length measurement

In indus­try and rese­arch, the demands on mea­su­ring tech­no­logy are incre­asing when it comes to the hig­hest pre­cis­ion and accu­racy. Espe­ci­ally in the cha­rac­te­ri­sa­tion of:

• Pre­cis­ion guides,
• Mea­su­ring, micro­scope and posi­tio­ning stages,
• Mea­su­ring and test­ing machines,
• Coor­di­nate mea­su­ring machines,
• Machine tools,
• Non-cont­act mea­su­re­ment of sur­faces and
• Tac­tile length mea­su­re­ment of thic­k­ness, con­tours and flatness.

Inter­fe­ro­me­tric mea­su­ring sys­tems deve­lo­ped by SIOS Mess­tech­nik GmbH set world­wide stan­dards in dimen­sion mea­su­re­ments. SIOS inter­fe­ro­me­ters rea­lise mea­su­ring ran­ges from a few nano­me­t­res up to 80 met­res com­bi­ned with low mea­su­re­ment uncer­tainty and high length reso­lu­tion. For the field of long-term mea­su­re­ment SIOS offers spe­cial inter­fe­ro­me­ters with modi­fied sen­sors, which gua­ran­tee hig­hest stability.

You want to know:

• Which inter­fe­ro­me­tric mea­su­ring sys­tem is sui­ta­ble for which mea­su­ring task?
• Which fac­tors influence mea­su­re­ment uncertainties?
• How you can imple­ment an Abbe error-free mea­su­re­ment setup?
• What to con­sider when crea­ting an opti­mal mea­su­ring arran­ge­ment or
• How you can mea­sure other degrees of free­dom such as pitch and yaw angles as well as straight­ness syn­chro­no­usly to the length?

The experts Peter Grund­schok and Wolf­ram Meyer get to the bot­tom of these and other questions.

Pro­gramme:

The Theory

• Basics of Interferometry
• Inse­cu­rity bud­get – an example

The Uni­ver­sa­lists: Sin­gle-beam and Three-beam Laser Interferometers

• setup, para­me­ters, spe­cial fea­tures and appli­ca­tion examples

The Spe­cia­lists: Dif­fe­ren­tial Laser Interferometer

• spe­cial fea­tures and dif­fe­ren­ces of SP-DI and SP-DI/F, fields of appli­ca­tion and usage in indus­try, rese­arch and as OEM systems

The reflec­tors: variety and characteristics

• Design and parameters

The high linear: Pre­cis­ion laser inter­fe­ro­me­tric probes

• tac­tile length mea­su­re­ment with pro­bes LM-20/LM-50

The exch­ange: hard­ware inter­faces and SIOS software

• Out­put and pro­ces­sing of mea­su­re­ment data

Spea­k­ers:

Peter Grund­schok, Sales Mana­ger, SIOS Meß­tech­nik GmbH and Wolf­ram Mayer, Sales Engi­neer, SIOS Meß­tech­nik GmbH

Tra­get group:

Mea­su­re­ment tech­ni­ci­ans, engi­neers, con­s­truc­tors, qua­lity mana­gers, pro­duc­tion plan­ners, pro­ject mana­gers and scientists

 

 

More infor­ma­ti­ons about the regis­tra­tion can you find  here.