SIOS WEB-Seminar • How to measure the invisible
SIOS WEB-Seminar • How to measure the invisible WITH THe Most Accurate MEasurement Systems
30 September 2021, 8.30 am CEST and 3.30 pm CEST • two identical web-seminars • time to choose according to your location • approx. 45 minutes each
Today’s technological developments follow a common trend in many manufacturing industries: Products are becoming more complex and powerful, the demands on manufacturing quality are constantly increasing, while components and object structures are becoming smaller and more compact.
In turn, the increasing industrial use of micro- and nanotechnological objects leads to ever higher demands on the measurement technology used in manufacturing, verification and positioning. The tasks are realized on objects that are getting larger and larger, so that a link between the macro- and nano-worlds has to be made.
Nanometrology is not only of great interest to the research or semiconductor industry, as a driver of the trend, it has long since found its way into areas such as nanoelectronics, microoptics, genetic engineering, molecular biology, materials research and many more.
In the approximately 45-minute webinar, you will learn how to measure the invisible with the most accurate measurement systems available from SIOS.
Your experts Dr. Denis Dontsov and his colleagues will provide information on the following main topics:
- ultra-stable high-resolution laser interferometers
- the basics of nanopositioning
- application of nanopositioning and nanomeasuring machine
The topic is relevant for measurement technicians, engineers, designers, quality managers, project managers and scientists.
Target industries: metrology, nanopositioning, coordinate metrology, optics industry, precision instrumentation, research and development
The Web-Seminar will be held in English language via ClickMeeting and is free of charge.
Please register at the SIOS event page
Veranstaltungsform
Online
Kontakt
SIOS Messtechnik GmbH
Ilka Oertel
+49 3677 6447 35
ed.sois@tcatnoc
https://sios-de.com/news/webinar-nanometrology/